Editorial Board

Senior Editors

Dr. Mihail Belkin, Technical University of Munich, Germany

Prof. Hoon Kim, Korea Advanced Institute of Science and Technology, Korea

Dr. Wibool Piyawattanametha, King Mongkut's Institute of Technology, Thailand

Dr. Andrew W. Poon, The Hong Kong University of Science and Technology, Hong Kong

Dr. Jonahan Wierer, North Carolina State University, USA

Associate Editors

Prof. Jose Azana, Institut National de la Recherche Scientifique, Canada

Dr. Jian Chen, Nanjing University of Posts and Telecommunications, China

Dr. Hao Chi, Hangzhou Dianzi University, China

Prof. Daoxin Dai, Zhejiang University, China

Dr. Angela Dudley, University of Witwatersrand, South Africa

Dr. Ivana Gasulla, Universidad Politecnica de Valencia, Spain

Dr. Amirhossein Ghazisaeidi, Nokia Bell Labs, France

Dr. Mariangela Gioannini, Politenico di Torino, Italy

Prof. Miguel González-Herráez, University of Alcalá, Spain

Dr. Lingling Huang, Beijing Institute of Technology, China

Dr. Ezra Ip, NEC Labs America, USA

Prof. Deep Jariwala, University of Pennsylvania, USA

Dr. Diaa Khalil, Ain Shams University, Egypt

Dr. Kwanil Lee, Korea Institute of Science and Technology, Korea

Dr. Ruben Luis, National Institute of Information and Communication Technology, Japan

Dr. Xianshu Luo, Advanced Micro Foundry Pte. Ltd, Singapore

Dr. Jason D. McKinney, Purdue University, USA

Dr. Sha Shiong Ng, University Science Malaysia, Malaysia

Dr. Pierluigi Poggiolini, Politecnico di Torino, Italy

Prof. San-Wan Ryu, Chonnam National University, Korea

Dr. Haiding Sun, Nanyang Technology Univeristy, Singapore

Dr. Dingyuan Tang, Nanyang Technology University, Singapore

Dr. Antonio Teixeira, Universidade de aveiro Instituto de telecomunicacoes, Portugal

Dr. Jing Xu, Zhejiang University, China

Prof. Zinan Wang, Univ. of Electronic Science & Tech China, China

Prof. Rui Q. Yang, University of Oklahoma, USA

Prof. Chao Zhao, Institute of Semiconductors, Chinese Academy of Sciences, China

Prof. Linjie Zhou, Shanghai Jiao Tong University, China

Prof. Renjie Zhou, The Chinese University of Hong Kong, Hong Kong

 

 


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