Standards Committee

Chair
John Kulick, Siemens


Committee Members
Douglas Baney, Keysight
Ken Barat, Laser Safety Solutions
Eric Belhaire, Thales
Peter Catrysse, Standford Univ.
Drew Guckenberger, Luxtera
Durdu Guney, Michigan Tech. University
Tom Hausken, The Optical Society
Yu Huang, Huazhong University of  Science and Technology
Bill Jacobsen, AFL Global
David Krohn, Lightwave Venture
Sylwester Latkowski, Eindhoven University of Technology 
Benjamin Lee, IBM
Karen Liu, Lightwave Logic
James Matthews, Corning
John Mazurowski, Applied Research Laboratory, Penn State University
William Oxford, Bra-Ket Science
Earl Parsons, CommScope
Qiong Chen, HBSQI
Zhou Xiozhuang, Wuhan Huagong Laser Engineering Co., Ltd.
Steve Bush, GE
David Millman, Bell Atlantic
Walter Charzenlco, EOSPACE Inc.
Huang Shangshi, Zhejiang Test Center for Laser and Photoelectric Products/
Liu Xiaoxu, Wenzhou Institute of Technology Testing and Calibration
Li Libo, Wuhan Raycus Fiber Laser Technologies Co.,Ltd.
Lu Feixing, Wuhan Huagong Laser Engineering Co., Ltd.
Li Ting, Wuhan Huagong Laser Engineering Co., Ltd.
Wu Xuhao, Highlaser OPTO-Electronic Technology Co., Ltd.
Yu Yuan, 0xSenses Corporation