Standards Committee
Chair
John Kulick
Committee Members
Sean Anderson, Macom
Ken Barat, Laser Safety Solutions
Steve Bush, GE
Peter Catrysse, Standford Univ.
Qiong Chen, HBSQI
Drew Guckenberger, Luxtera
Tom Hausken, Optica (formerly OSA)
Bill Jacobsen, AFL Global
Wei Jiang, Nanjing University, China
David Krohn, Lightwave Venture
Sylwester Latkowski, Eindhoven University of Technology
Karen Liu, Lightwave Logic
James Matthews, Corning
John Mazurowski, Applied Research Laboratory, Penn State University
David Millman, Bell Atlantic
Liu Xiaoxu, Wenzhou Institute of Technology Testing and Calibration
Yu Yuan, Self
Staff Support
Digital Community & Presence Manager
Kerrianne Sullivan
Email: k.sullivan@ieee.org