Standards Committee

Chair
John Kulick, Siemens

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Committee Members

Sean Anderson, Macom
Ken Barat, Laser Safety Solutions
Steve Bush, GE
Peter Catrysse, Standford Univ.
Qiong Chen, HBSQI
Drew Guckenberger, Luxtera
Tom Hausken, The Optical Society
Bill Jacobsen, AFL Global
Wei Jiang, Nanjing University, China
David Krohn, Lightwave Venture
Sylwester Latkowski, Eindhoven University of Technology 
Karen Liu, Lightwave Logic
James Matthews, Corning
John Mazurowski, Applied Research Laboratory, Penn State University
David Millman, Bell Atlantic
Liu Xiaoxu, Wenzhou Institute of Technology Testing and Calibration
Yu Yuan, Self

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Staff Support